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Friday, February 28, 2014

Toshiba Nanoanalysis Corporation Expands Capabilities with ZEISS Xradia 520 Versa

Thornwood, N.Y. Carl Zeiss X-ray Microscopy, formerly Xradia, Inc., announced today that Kawasaki, Japan-based Toshiba Nanoanalysis Corporation has selected the recently-introduced ZEISS Xradia 520 Versa 3D X-ray microscope to expand the capabilities of its busy analysis lab.

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